杉本　 宜昭 （ Sugimoto Yoshiaki ）

システムID: SugimotoYoshiaki
杉本　 宜昭 （スギモト ヨシアキ）
Sugimoto Yoshiaki
メールアドレス：（ログイン後閲覧できます）
Web：http://www.afm.eei.eng.osaka-u.ac.jp/people.html
所属班A03班　分子機能の設計・計測
研究課題ＡＦＭ／ＳＴＭによる力刺激に対する分子系の応答の解明
役割研究代表者
役職准教授
所属研究機関東京大学
新領域創成科学研究科　物質系専攻　単原子分子科学
所在地 〒277-8561
千葉県 柏市柏の葉５－１－５
電話番号（ログイン後閲覧できます）
FAX番号（ログイン後閲覧できます）
専門分野走査型プローブ顕微鏡, 非接触原子間力顕微鏡
研究キーワードナノ力学

Papers List

2017

[24] Strain-induced skeletal rearrangement of a polycyclic aromatic hydrocarbon on a copper surface [重要文献]

A. Shiotari; T. Nakae; K. Iwata; S. Mori; T. Okujima; H. Uno; H. Sakaguchi; Y. Sugimoto
Nature Communications, 8, 16089, 2017
DOI: 10.1038/ncomms16089

[23] Electronegativity determination of individual surface atoms by atomic force microscopy

J. Onoda; M. Ondracek; P. Jelinek; Y. Sugimoto
Nature Communications, 8, 15155, 2017
DOI: 10.1038/ncomms15155

[22] The Local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations

A. Yurtsever; D. Fernandez-Torre; J. Onoda; M. Abe; S. Morita; Y. Sugimoto; R. Perez
Nanoscale, 9, 5812, 2017
DOI: 10.1039/c6nr07550a

[21] Ultrahigh-resolution imaging of water networks by atomic force microscopy

A. Shiotari; Y. Sugimoto
Nature Communications, 8, 14313, 2017
DOI: 10.1038/ncomms14313

[20] Mechanical properties on In/Si(111)-(8x2) investigated by atomic force microscopy

K. Iwata; S. Yamazaki; A. Shiotari; Y. Sugimoto
Japanese Journal of Applied Physics, 56, 015701, 2017
DOI: 10.7567/JJAP.56.015701

[19] Straight Imaging and Mechanism behind Grain Boundary Electron Emission in Pt-doped Ultrananocrystalline Diamond Films

K. Panda; E. Inami; Y. Sugimoto; K.J. Sankaran; I.-N. Lin
Carbon, 111, 8, 2017
DOI: 10.1016/j.carbon.2016.09.062

2016

[18] Effects of Pb intercalation on the structural and electronic properties of epitaxial graphene on SiC

A. Yurtsever; Jo Onoda; T. Iimori; K. Niki; T. Miyamachi; M. Abe; S. Mizuno; S. Tanaka; F. Komori; Y. Sugimoto
Small, 12, 3956, 2016
DOI: 10.1002/smll.201600666

[17] Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force

E. Inami; Y. Sugimoto
Japanese Journal of Applied Physics, 55, 08NB05, 2016
DOI: 10.7567/JJAP.55.08NB05

[16] Atomic Force Microscopy for Imaging, Identification and Manipulation of Single Atoms

Y. Sugimoto
e-Journal of Surface Science and Nanotechnology, 14, 28, 2016
DOI: 10.1380/ejssnt.2016.28

[15] Imaging the TiO2(011)-(2x1) Surface using Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy

A. Yurtsever; J. Onoda; M. Abe; C.L. Pang; Y. Sugimoto
The Journal of Physical Chemistry C, 120, 3390, 2016
DOI: 10.1021/acs.jpcc.5b11703

2015

[14] Identification of Si and Ge atoms by atomic force microscopy

J. Onoda; K. Niki; Y. Sugimoto
Phys. Rev. B, 92, 155309, 2015
DOI: 10.1103/PhysRevB.92.155309

[13] Chemical structure imaging of a single molecule by atomic force microscopy at room temperature

K. Iwata; S. Yamazaki; P. Mutombo; P. Hapala; M. Ondracek; P. Jelinek; Y. Sugimoto
Nature Communications, 6, 7766, 2015/7/16
DOI: 10.1038/ncomms8766

[12] Accurate extraction of electrostatic force by a voltage–pulse force spectroscopy

E. Inami; Y. Sugimoto
Physical Review Letters, 114, 246102, 2015/6/19
DOI: 10.1103/PhysRevLett.114.246102

[11] Interplay between switching driven by the tunneling current and atomic force of a bistable four-atom Si quantum dot

S. Yamazaki; K. Maeda; Y. Sugimoto; M. Abe; V. Zobac; P. Pou; L. Rodrigo; P. Mutombo; R. Perez; P. Jelinek; S. Morita
Nano Letters, 15, 4356, 2015
DOI: 10.1021/acs.nanolett.5b00448

[10] Room-temperature-concerted switch made of a binary atom cluster

Eiichi Inami; Ikutaro Hamada; Keiichi Ueda; Masayuki Abe; Seizo Morita; Yoshiaki Sugimoto
Nature Communications, 6, 6231, , 2015/February/06
DOI: 10.1038/ncomms7231

[9] Pt atoms adsorbed on TiO2(110)(1x1) studied with noncontact atomic force microscopy and firstprinciples simulations

Delia Fernández-Torre; Ayhan Yurtsever; Jo Onoda; Masayuki Abe; Seizo Morita; Yoshiaki Sugimoto; Rubén Pérez
Phys. Rev. B, 91, 075401, , 2015/February/02
DOI: 10.1103/PhysRevB.91.075401

2014

[8] Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations

*Jo Onoda; Martin Ondráček; Ayhan Yurtsever; Pavel Jelínek; Yoshiaki Sugimoto
Appl. Phys. Lett., 104, 133107, , 2014/March/31
DOI: 10.1063/1.4870629

[7] Subsurface charge repulsion of adsorbed H-adatoms on TiO2(110)

Jo Onoda; *Chi Lun Pang ; *Ayhan Yurtsever; Yoshiaki Sugimoto
J. Phys. Chem. C, 118, 25, 13674 - 13679, 2014/May/12
DOI: 10.1021/jp503402w

[6] Mechanical gate control for atom-by-atom cluster assembly with scanning probe microscopy

Yoshiaki Sugimoto; Ayhan Yurtsever; Naoki Hirayama; Masayuki Abe; Seizo Morita
Nature Communications, 5, 4360, , 2014/July/11
DOI: 10.1038/ncomms5360

[5] Improved study of electric dipoles on the Si(100)-2x1 surface by non-contact scanning nonlinear dielectric microscopy

Masataka Suzuki; Kohei Yamasue; Masayuki Abe; Yoshiaki Sugimoto; Yasuo Cho
Appl. Phys. Lett., 105, 101603, , 2014/September/8
DOI: 10.1063/1.4895031

[4] (2nx1) Reconstructions of TiO2(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy

*Chi Lun Pang; *Ayhan Yurtsever; Jo Onoda; Yoshiaki Sugimoto; Geoff Thornton
J. Phys. Chem. C, 118, 40, 23168 - 23174, 2014/September/08
DOI: 10.1021/jp507422s

[3] Atomic-dipole-moment induced local surface potential on Si(111)-(7x7) surface studied by non-contact scanning nonlinear dielectric microscopy

Kohei Yamasue; Masayuki Abe; Yoshiaki Sugimoto; Yasuo Cho
Appl. Phys. Lett., 105, 121601, , 2014/September/22
DOI: 10.1063/1.4896323

[2] Direct observation and mechanism for enhanced field emission sites in platinum ion implanted/post-annealed ultrananocrystalline diamond films

Kalpataru Panda; Kamatchi J. Sankaran; Eiichi Inami; Yoshiaki Sugimoto; Nyan Hwa Tai; I-Nan Lin
Appl. Phys. Lett., 105, 163109, , 2014/October/20
DOI: 10.1063/1.4898571

[1] Identifying the absolute orientation of a low-symmetry surface in real space

Stefan Kuhn; Markus Kittelmann; Yoshiaki Sugimoto; Masayuki Abe; Angelika Kühnle; Philipp Rahe
Phys. Rev. B, 90, 195405, , 2014/November/5
DOI: 10.1103/PhysRevB.90.195405